Sub-Diffraction Nano Manipulation Using STED AFM
نویسندگان
چکیده
منابع مشابه
Sub-Diffraction Nano Manipulation Using STED AFM
In the last two decades, nano manipulation has been recognized as a potential tool of scientific interest especially in nanotechnology and nano-robotics. Contemporary optical microscopy (super resolution) techniques have also reached the nanometer scale resolution to visualize this and hence a combination of super resolution aided nano manipulation ineluctably gives a new perspective to the sce...
متن کاملSensitivity Analysis of Coulomb and HK Friction Models in 2D AFM-Based Nano-Manipulation: Sobol Method
Nanotechnology involves the ability to see and control individual atoms and molecules which are about 100 nanometer or smaller. One of the major tools used in this field is atomic force microscopy which uses a wealth of techniques to measure the topography and investigates the surface forces in nanoscale. Friction force is the representation of the surface interaction between two surfaces an...
متن کاملSub-Abbe resolution: from STED microscopy to STED lithography
Commonly, in stimulated emission depletion (STED) fluorescence nanoscopy, light of a wavelength located at the red tail of the emission spectrum of the dye is used to shrink the effective fluorophore excitation volume and thus to obtain images with sub diffraction resolution. Here, we demonstrate that continuous wave (CW) STED nanoscopy is feasible using STED wavelengths located at the emission...
متن کاملsensitivity analysis of coulomb and hk friction models in 2d afm-based nano-manipulation: sobol method
nanotechnology involves the ability to see and control individual atoms and molecules which are about 100 nanometer or smaller. one of the major tools used in this field is atomic force microscopy which uses a wealth of techniques to measure the topography and investigates the surface forces in nanoscale. friction force is the representation of the surface interaction between two surfaces an...
متن کاملsliding mode control of afm in cantact mode during manipulation of nano-particle
abstract: application of atomic force microscope as a manipulator for pushing-based positioning of nano-particles has been of considerable interest during recent years. however a detailed modeling of the interaction forces and control on the afm tip is important for prosperous manipulation control, a reliable control of the afm tip position during the afm-based manipulation process is a main is...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: PLoS ONE
سال: 2013
ISSN: 1932-6203
DOI: 10.1371/journal.pone.0066608